Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Applied Superconductivity, 5(34), p. 1-5, 2024
DOI: 10.1109/tasc.2024.3358255
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Electromagnetic-Mechanical Simulation of High-Field Test Coils and Conductor Degradation
Journal article published in 2024 by
Yufan Yan 
,
Jeonghwan Park ,
Jaemin Kim ,
Uijong Bong ,
Geonyoung Kim ,
Wonseok Jang ,
Seungyong Hahn
,
Jeonghwan Park ,
Jaemin Kim ,
Uijong Bong ,
Geonyoung Kim ,
Wonseok Jang ,
Seungyong Hahn
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