Understanding genetic architectures of yield and yield-related traits of wheat (Triticum aestivum L.) grown under dryland or irrigated conditions is pivotal for developing modern high-yielding germplasm and cultivars. The objectives of this study were to detect quantitative trait loci (QTL) linked to yield and yield components using a mapping population derived from ‘TAM 113’/‘Gallagher’, including 191 recombinant inbred lines (RILs). The population was grown in McGregor, College Station, and Bushland, Texas, for three consecutive years from 2019 to 2021. A high-density genetic map covering all 21 chromosomes was constructed using a set of 8,075 single nucleotide polymorphisms (SNPs) obtained using genotyping-by-sequencing (GBS). A total of 147 QTLs for 16 yield-related traits were identified, which included 16 QTLs consistently detected in multiple experiments and 8 QTLs that showed pleiotropic effects. Of them, five pleiotropic QTLs overlapped with the consistent QTL. They increased grain yield (YLD) up to 37.64 g m−2, thousand kernel weight (TKW) up to 1.33 g, harvest (HI) up to 0.97%, kernel length up to 0.08 mm, and kernel width up to 0.04 mm with Gallagher alleles and increased YLD up to 22.21 g m−2, kernels spike−1 up to 1.77, TKW up to 1.14 g, and HI up to 3.72% with TAM 113 alleles. One major and consistent QTL on chromosome 2D at 34.4 Mbp overlapped with the major photoperiod gene Ppd-D1 and was affected by multiple traits, including kernel diameter (DIAM), TKW, kernel hardness index (KHI), heading date (HD), and plant height (PH). Another QTL cluster region on 7D between 52 and 66 Mbp, encompassing one consistent and three pleiotropic QTLs. One of the pleiotropic QTLs at 52 Mbp increased YLD up to 24.16 g m−2, HI up to 1%, and DIAM up to 0.03 mm. This study dissected genetic loci associated with yield and yield-related traits, providing valuable information on wheat improvement using marker-assisted selection (MAS).