Metal-organic frameworks (MOFs) have received increased attention in recent years due to their exceptional properties and versatility. MOFs consist of metal nodes connected by organic linkers. Particularly interesting are surface-anchored films (SURMOFs), which are grown on bulk substrates. Transmission electron microscopy (TEM) is a key technique for the analysis of the structural and chemical properties of SURMOFs on the nanoscale. For TEM sample preparation, however, the SURMOF film must be detached from the bulk substrate and transferred to an electron-transparent support. This detachment process is a severe source of damage for the SURMOF film. The preparation of SURMOFs for TEM studies is thus an obstacle that has not yet been solved satisfactorily.