Published in

Elsevier, Surfaces and Interfaces, (44), p. 103620, 2024

DOI: 10.1016/j.surfin.2023.103620

Links

Tools

Export citation

Search in Google Scholar

Impact of post-deposition annealing on the electronic properties of Al2O3/GaN interface by first-principles study

Distributing this paper is prohibited by the publisher
Distributing this paper is prohibited by the publisher

Full text: Unavailable

Red circle
Preprint: archiving forbidden
Orange circle
Postprint: archiving restricted
Red circle
Published version: archiving forbidden
Data provided by SHERPA/RoMEO