Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Electron Devices, 3(71), p. 1827-1833, 2024
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BEOL-Compatible MFMIS Ferroelectric/Anti-Ferroelectric FETs—Part I: Experimental Results With Boosted Memory Window
Journal article published in 2024 by
Zijie Zheng 
,
Leming Jiao ,
Dong Zhang,
Chen Sun ,
Zuopu Zhou ,
Xiaolin Wang ,
Gan Liu ,
Qiwen Kong ,
Yue Chen,
Kai Ni ,
Xiao Gong
,
Leming Jiao ,
Dong Zhang,
Chen Sun ,
Zuopu Zhou ,
Xiaolin Wang ,
Gan Liu ,
Qiwen Kong ,
Yue Chen,
Kai Ni ,
Xiao Gong
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