Published in
Institute of Electrical and Electronics Engineers, IEEE Access, (11), p. 127725-127736, 2023
DOI: 10.1109/access.2023.3329077
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A Pragmatic Model to Predict Future Device Aging
Journal article published in 2023 by
James Brown 
,
Kean Hong Tok,
Rui Gao ,
Zhigang Ji ,
Weidong Zhang ,
John S. Marsland,
Thomas Chiarella ,
Jacopo Franco ,
Ben Kaczer ,
Dimitri Linten,
Jian Fu Zhang
,
Kean Hong Tok,
Rui Gao ,
Zhigang Ji ,
Weidong Zhang ,
John S. Marsland,
Thomas Chiarella ,
Jacopo Franco ,
Ben Kaczer ,
Dimitri Linten,
Jian Fu Zhang
This paper is made freely available by the publisher.
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