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Orientation effect of the Wafer on the Structural properties of p+ Type Porous Silicon Layers

Journal article published in 2000 by C. Faivre, D. Bellet ORCID
This paper was not found in any repository; the policy of its publisher is unknown or unclear.
This paper was not found in any repository; the policy of its publisher is unknown or unclear.

Full text: Unavailable

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Postprint: policy unknown
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Published version: policy unknown