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Institute of Electrical and Electronics Engineers, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 4(43), p. 1135-1148, 2024

DOI: 10.1109/tcad.2023.3331968

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Toward Critical Flip-Flop Identification for Soft-Error Tolerance With Graph Neural Networks

Journal article published in 2024 by Li Lu ORCID, Junchao Chen ORCID, Markus Ulbricht ORCID, Milos Krstic ORCID
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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