Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Circuits and Systems II: Express Briefs, p. 1-1, 2024
DOI: 10.1109/tcsii.2024.3362957
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Test Cost Reduction for VLSI Adaptive Test With K-Nearest Neighbor Classification Algorithm
Journal article published in 2024 by
Tai Song 
,
Zhengfeng Huang ,
Li Zhang ,
Qi Hong,
Zhao Yang,
Milos Krstic
,
Zhengfeng Huang ,
Li Zhang ,
Qi Hong,
Zhao Yang,
Milos Krstic
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