International Union of Crystallography, Journal of Applied Crystallography, 5(56), p. 1537-1543, 2023
DOI: 10.1107/s1600576723007963
Full text: Unavailable
This article proposes a robust method for desmearing 1D small-angle scattering (SAS) intensity profiles. Using the central-moment-expansion technique, smearing in SAS intensity profiles is achieved in a model-free manner, eliminating the need for presumptive input during the desmearing. This innovative approach enables data analysis of SAS data without the resolution being convoluted with the structural model, thereby facilitating faster implementation and performance of fitting functions directly from the scattering models.