Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Electron Devices, 6(70), p. 3005-3010, 2023
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Transconductance Overshoot, a New Trap-Related Effect in AlGaN/GaN HEMTs
Journal article published in 2023 by
Gao Zhan 
,
Fabiana Rampazzo,
Carlo De Santi ,
Mirko Fornasier ,
Gaudenzio Meneghesso ,
Matteo Meneghini ,
Hervé Blanck,
Jan Grünenpütt,
Daniel Sommer,
Ding Yuan Chen ,
Kai-Hsin Wen,
Jr-Tai Chen,
Enrico Zanoni
,
Fabiana Rampazzo,
Carlo De Santi ,
Mirko Fornasier ,
Gaudenzio Meneghesso ,
Matteo Meneghini ,
Hervé Blanck,
Jan Grünenpütt,
Daniel Sommer,
Ding Yuan Chen ,
Kai-Hsin Wen,
Jr-Tai Chen,
Enrico Zanoni
This paper was not found in any repository, but could be made available legally by the author.
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