Abstract The residence timescales of antecrystic minerals contribute a key piece of information regarding the petrologic evolution of transcrustal magmatic systems and may be inferred using a combination of observations derived from microanalytical chemistry and diffusion modelling. Here, we present state-of-the-art stacked CMOS-type active pixel sensor (SCAPS) isotopographic images of tephra-hosted plagioclase microantecrysts from Tongariro Volcanic Centre in the southern Taupo Volcanic Zone, New Zealand. These crystals exhibit high-frequency Sr and anorthite zonation at sub-micron spatial resolution. We also find that all crystals display high-frequency intracrystalline Sr chemical potential variations, indicating that they have not resided at magmatic temperature for diffusive relaxation to advance significantly. To quantify crystal residence times at the well-constrained magmatic temperatures of these tephras, we first forward-modeled intracrystalline Sr diffusion over time using numerical methods. Results were then analyzed using novel spatial Fourier-transform techniques developed to understand the systematics the diffusive decay of Sr disequilibria in the spatial frequency domain. This ultimately permitted the estimation of Sr concentration profiles at crystal formation, prior to uptake into the carrier melt at the onset of eruption. Our data imply residence times of hours to days for the studied microantecrysts. This is inconsistent with long antecryst residence times in magmatic mushes at elevated temperatures, pointing instead to a cool plutonic nature of the magmatic plumbing system beneath the southern Taupo Volcanic Zone.