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Metrics reloaded: Pitfalls and recommendations for image analysis validation

Published in 2022 by Lena Maier-Hein, Annika Reinke, Patrick Godau, Florian Büttner, Evangelia Christodoulou, Ben Glocker, Minu D. Tizabi, Fabian Isensee, Jens Kleesiek, Michal Kozubek, Mauricio Reyes, Michael A. Riegler, Manuel Wiesenfarth, A. Emre Kavur, A. Emre Kavur and other authors.
This paper was not found in any repository; the policy of its publisher is unknown or unclear.
This paper was not found in any repository; the policy of its publisher is unknown or unclear.

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