Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Electron Devices, 12(70), p. 6600-6605, 2023
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Fatigue of NbO<sub> x </sub>-Based Locally Active Memristors—Part I: Experimental Characteristics
Journal article published in 2023 by
Yanting Ding,
Yu Li 
,
Shujing Jia,
Pei Chen ,
Xumeng Zhang ,
Wei Wang,
Yang Li,
Yunxia Hao,
Jinshun Bi ,
Tiancheng Gong ,
Hao Jiang ,
Ming Wang ,
Qi Liu ,
Ningsheng Xu,
Ming Liu
,
Shujing Jia,
Pei Chen ,
Xumeng Zhang ,
Wei Wang,
Yang Li,
Yunxia Hao,
Jinshun Bi ,
Tiancheng Gong ,
Hao Jiang ,
Ming Wang ,
Qi Liu ,
Ningsheng Xu,
Ming Liu
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