Published in
EDP Sciences, European Physical Journal - Special Topics, 1(167), p. 121-126
DOI: 10.1140/epjst/e2009-00946-3
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The utility of resonant soft x-ray scattering and reflectivity for the nanoscale characterization of polymers
Journal article published in 2009 by
Sufal Swaraj,
Cheng Wang,
T. Araki 
,
Gary E. Mitchell,
Lijun Liu,
Scott Gaynor,
Bala Deshmukh,
H. Yan,
Christopher R. McNeill ,
Harald Ade
,
Gary E. Mitchell,
Lijun Liu,
Scott Gaynor,
Bala Deshmukh,
H. Yan,
Christopher R. McNeill ,
Harald Ade
This paper is available in a repository.
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