Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Nuclear Science, 5(68), p. 634-641, 2021
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Impact of Terrestrial Neutrons on the Reliability of SiC VD-MOSFET Technologies
Journal article published in 2021 by
C. Martinella 
,
R. G. Alia ,
R. Stark ,
A. Coronetti ,
C. Cazzaniga ,
M. Kastriotou ,
Y. Kadi ,
R. Gaillard,
U. Grossner ,
A. Javanainen
,
R. G. Alia ,
R. Stark ,
A. Coronetti ,
C. Cazzaniga ,
M. Kastriotou ,
Y. Kadi ,
R. Gaillard,
U. Grossner ,
A. Javanainen
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