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American Institute of Physics, Review of Scientific Instruments, 4(92), p. 049901, 2021

DOI: 10.1063/5.0052231

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Erratum: “Sub-10 nm spatial resolution for electrical properties measurements using bimodal excitation in electric force microscopy” [Rev. Sci. Instrum. 92, 023703 (2021)]

Journal article published in 2021 by Khaled Kaja ORCID, Denis Mariolle ORCID, Nicolas Chevalier ORCID, Adnan Naja ORCID, Mustapha Jouiad ORCID
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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