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American Institute of Physics, Applied Physics Letters, 16(118), p. 163102, 2021

DOI: 10.1063/5.0046789

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Quantifying the temperature of heated microdevices using scanning thermal probes

Journal article published in 2021 by Amin Reihani ORCID, Shen Yan ORCID, Yuxuan Luan ORCID, Rohith Mittapally, Edgar Meyhofer ORCID, Pramod S. Reddy ORCID
This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

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