Published in
2021 International Symposium on VLSI Design, Automation and Test (VLSI-DAT), 2021
DOI: 10.1109/vlsi-dat52063.2021.9427329
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A Compact Thermal Sensor with Duty-Cycle Modulation on 1200 µm<sup>2</sup> in 7nm FinFET
Proceedings article published in 2021 by
Matthias Eberlein,
Harald Pretl 
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