Published in
Elsevier, Journal of Nuclear Materials, (555), p. 153143, 2021
DOI: 10.1016/j.jnucmat.2021.153143
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The quantitative 6H-SiC crystal damage depth profiling
Journal article published in 2021 by
M. Gloginjić 
,
M. Erich,
M. Kokkoris ,
E. Liarokapis ,
S. Fazinić,
M. Karlušić,
K. Tomić Luketić ,
S. Petrović
,
M. Erich,
M. Kokkoris ,
E. Liarokapis ,
S. Fazinić,
M. Karlušić,
K. Tomić Luketić ,
S. Petrović
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