Published in
2021 IEEE 12th Latin America Symposium on Circuits and System (LASCAS), 2021
DOI: 10.1109/lascas51355.2021.9459134
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Radiation-Hardness-by-Design Latch-based Triple Modular Redundancy Flip-Flops
Proceedings article published in 2021 by
Oliver Schrape,
Anselm Breitenreiter,
Carsten Schulze,
Steffen Zeidler,
Milos Krstic 
This paper was not found in any repository, but could be made available legally by the author.
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