Published in
Springer, Applied Magnetic Resonance, 3-5(53), p. 821-853, 2021
DOI: 10.1007/s00723-021-01407-1
Links
Tools
Probing Wave Functions of Electrically Active Shallow Level Defects by Means of High-Frequency Pulsed ENDOR in Wide Bandgap Materials: SiC, AlN, ZnO, and AgCl
Journal article published in 2021 by
S. B. Orlinskii,
V. A. Soltamov 
,
G. V. Mamin,
O. G. Poluektov,
J. Schmidt,
P. G. Baranov
,
G. V. Mamin,
O. G. Poluektov,
J. Schmidt,
P. G. Baranov
This paper is made freely available by the publisher.
Full text: Download
Published version:
archiving forbidden
Data provided by 