Highest resolution chemical imaging based on secondary ion mass spectrometry performed on the helium ion microscope
Journal article published in 2021 by
Jean-Nicolas Audinot 
,
Patrick Philipp ,
Olivier De Castro ,
Antje Biesemeier ,
Quang Hung Hoang,
Tom Wirtz
,
Patrick Philipp ,
Olivier De Castro ,
Antje Biesemeier ,
Quang Hung Hoang,
Tom Wirtz
This paper is made freely available by the publisher.
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