Published in
2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2021
DOI: 10.1109/dft52944.2021.9568355
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A Tunable Single Event Transient Filter Based on Digitally Controlled Capacitive Delay Cells
Proceedings article published in 2021 by
Marko Andjelkovic,
Oliver Schrape,
Anselm Breitenreiter,
Junchao Chen,
Milos Krstic 
This paper was not found in any repository, but could be made available legally by the author.
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