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Trans Tech Publications, Materials Science Forum, (740-742), p. 117-120, 2013

DOI: 10.4028/www.scientific.net/msf.740-742.117

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X-Ray Diffraction and Raman Spectroscopy Study of Strain in Graphene Films Grown on 6H-SiC(0001) Using Propane-Hydrogen-Argon CVD

Journal article published in 2013 by Adrien Michon, Ludovic Largeau, Antoine Tiberj, Jean Roch Huntzinger, Olivia Mauguin, Stephane Vezian, Denis Lefebvre, Fabien Cheynis, Frédéric Leroy, Pierre Müller, Thierry Chassagne ORCID, Marcin Zielinski ORCID, Marc Portail
This paper is available in a repository.
This paper is available in a repository.

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Abstract

We have grown graphene films on 6H-SiC(0001) using propane CVD and evidenced the strong impact of the hydrogen/argon mixture used as the carrier gas on the graphene/SiC interface and on the orientation of graphene layers. By studying a set of samples grown with different hydrogen/argon mixture using Raman spectroscopy and grazing incidence X-ray diffraction, we evidence the links between graphene/SiC interface and strain in graphene.