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American Institute of Physics, Journal of Applied Physics, 19(130), p. 195108, 2021

DOI: 10.1063/5.0069046

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Resistivity size effect due to surface steps on ruthenium thin films computed with a realistic tight-binding model

Journal article published in 2021 by W. E. Richardson ORCID, E. R. Mucciolo ORCID, P. K. Schelling ORCID
This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

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