Published in

International Union of Crystallography, IUCrJ, 2(9), p. 328-328, 2022

DOI: 10.1107/s2052252522000501

Links

Tools

Export citation

Search in Google Scholar

An advanced workflow for single-particle imaging with the limited data at an X-ray free-electron laser. Corrigendum

Journal article published in 2022 by Dameli Assalauova, Young Yong Kim ORCID, Sergey Bobkov ORCID, Ruslan Khubbutdinov, Max Rose ORCID, Roberto Alvarez, Jakob Andreasson, Eugeniu Balaur, Alice Contreras, Hasan DeMirci, Luca Gelisio ORCID, Janos Hajdu, Mark S. Hunter, Ruslan P. Kurta ORCID, Haoyuan Li and other authors.
This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

Full text: Download

Green circle
Preprint: archiving allowed
Upload
Green circle
Postprint: archiving allowed
Upload
Red circle
Published version: archiving forbidden
Policy details
Data provided by SHERPA/RoMEO

Abstract

An error in Fig. 3(c) of the article by Assalauova et al. [IUCrJ (2020), 7, 1102–1113] is corrected.