Published in
International Union of Crystallography, IUCrJ, 2(9), p. 328-328, 2022
DOI: 10.1107/s2052252522000501
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An advanced workflow for single-particle imaging with the limited data at an X-ray free-electron laser. Corrigendum
Journal article published in 2022 by
Dameli Assalauova,
Young Yong Kim 
,
Sergey Bobkov ,
Ruslan Khubbutdinov,
Max Rose ,
Roberto Alvarez,
Jakob Andreasson,
Eugeniu Balaur,
Alice Contreras,
Hasan DeMirci,
Luca Gelisio ,
Janos Hajdu,
Mark S. Hunter,
Ruslan P. Kurta ,
Haoyuan Li
and other authors.
,
Sergey Bobkov ,
Ruslan Khubbutdinov,
Max Rose ,
Roberto Alvarez,
Jakob Andreasson,
Eugeniu Balaur,
Alice Contreras,
Hasan DeMirci,
Luca Gelisio ,
Janos Hajdu,
Mark S. Hunter,
Ruslan P. Kurta ,
Haoyuan Li
and other authors.
This paper is made freely available by the publisher.
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Abstract
An error in Fig. 3(c) of the article by Assalauova et al. [IUCrJ (2020), 7, 1102–1113] is corrected.