Published in
American Institute of Physics, Applied Physics Letters, 7(120), p. 073502, 2022
DOI: 10.1063/5.0069655
Links
Tools
A trapping tolerant drain current based temperature measurement of β-Ga<sub>2</sub>O<sub>3</sub> MOSFETs
Journal article published in 2022 by
Xiang Zheng 
,
Taylor Moule,
James W. Pomeroy ,
Masataka Higashiwaki ,
Martin Kuball
,
Taylor Moule,
James W. Pomeroy ,
Masataka Higashiwaki ,
Martin Kuball
This paper is made freely available by the publisher.
Full text: Download
Data provided by 