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Автометрия, 5(57), p. 38-47, 2021

DOI: 10.15372/aut20210505

Springer, Optoelectronics, Instrumentation and Data Processing, 5(57), p. 476-484, 2021

DOI: 10.3103/s8756699021050150

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Ellipsometric In Situ Methods of Temperature Control in the Technology of Growing MBE MCT Layers

Journal article published in 2021 by V. A. Shvets, D. V. Marin, I. A. Azarov ORCID, M. V. Yakushev, S. V. Rykhlitskii
This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

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