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Wiley, Advanced Materials Interfaces, 16(9), p. 2102340, 2022

DOI: 10.1002/admi.202102340

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Growth‐Related Formation Mechanism of I3‐Type Basal Stacking Fault in Epitaxially Grown Hexagonal Ge‐2H

This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

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