Published in

IOP Publishing, Journal of Physics: Condensed Matter, 32(34), p. 324003, 2022

DOI: 10.1088/1361-648x/ac7500

Links

Tools

Export citation

Search in Google Scholar

Resonant inelastic soft x-ray scattering on LaPt<sub>2</sub>Si<sub>2</sub>

This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

Full text: Download

Green circle
Preprint: archiving allowed
Orange circle
Postprint: archiving restricted
Red circle
Published version: archiving forbidden
Data provided by SHERPA/RoMEO

Abstract

Abstract X-ray absorption and resonant inelastic x-ray scattering spectra of LaPt2Si2 single crystal at the Si 2p and La 4d edges are presented. The data are interpreted in terms of density functional theory, showing that the Si spectra can be described in terms of Si s and d local partial density of states (LPDOS), and the La spectra are due to quasi-atomic local 4f excitations. Calculations show that Pt d-LPDOS dominates the occupied states, and a sharp localized La f state is found in the unoccupied states, in line with the observations.