Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Information Forensics and Security, (17), p. 2272-2283, 2022
DOI: 10.1109/tifs.2022.3183410
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Journal article published in 2022 by
Yingfan Tao 
,
Wenxian Zheng,
Wenming Yang ,
Guijin Wang ,
Qingmin Liao
,
Wenxian Zheng,
Wenming Yang ,
Guijin Wang ,
Qingmin Liao
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