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Institute of Electrical and Electronics Engineers, IEEE Journal of the Electron Devices Society, (10), p. 540-546, 2022

DOI: 10.1109/jeds.2022.3189819

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Dynamic Characteristics of GaN MISHEMT With 5-nm In-Situ SiN<sub>x</sub> Dielectric Layer

Journal article published in 2022 by Yu Zhang ORCID, Lihua Xu, Yitian Gu ORCID, Haowen Guo, Huaxing Jiang, Kei May Lau ORCID, Xinbo Zou ORCID
This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

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