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American Chemical Society, ACS Applied Nano Material, 10(5), p. 14759-14770, 2022

DOI: 10.1021/acsanm.2c03074

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Focused Ion Beam vs Focused Electron Beam Deposition of Cobalt Silicide Nanostructures Using Single-Source Precursors: Implications for Nanoelectronic Gates, Interconnects, and Spintronics

Journal article published in 2022 by Felix Jungwirth ORCID, Fabrizio Porrati ORCID, Daniel Knez ORCID, Masiar Sistani ORCID, Harald Plank ORCID, Michael Huth ORCID, Sven Barth ORCID
This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

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