Published in
Elsevier, Microelectronics Reliability, (138), p. 114726, 2022
DOI: 10.1016/j.microrel.2022.114726
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PS-BBICS: Pulse stretching bulk built-in current sensor for on-chip measurement of single event transients
Journal article published in 2022 by
Marko Andjelkovic,
Milos Marjanovic,
Junchao Chen,
Stefan Ilic,
Goran Ristic,
Milos Krstic 
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