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Elsevier, Microelectronics Reliability, (138), p. 114724, 2022

DOI: 10.1016/j.microrel.2022.114724

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Modeling the electrical characteristic of InGaN/GaN blue-violet LED structure under electrical stress

Journal article published in 2022 by Nicola Roccato ORCID, Francesco Piva ORCID, Carlo De Santi, Matteo Buffolo, Camille Haller, Jean-François Carlin, Nicolas Grandjean, Marco Vallone, Alberto Tibaldi, Francesco Bertazzi, Michele Goano, Giovanni Verzellesi, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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