Published in
2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2022
DOI: 10.1109/dft56152.2022.9962345
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Evaluating Read Disturb Effect on RRAM based AI Accelerator with Multilevel States and Input Voltages
Proceedings article published in 2022 by
Jianan Wen,
Andrea Baroni,
Eduardo Perez,
Markus Ulbricht,
Christian Wenger,
Milos Krstic 
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