Published in
Institute of Electrical and Electronics Engineers, IEEE Journal of the Electron Devices Society, (11), p. 43-46, 2023
DOI: 10.1109/jeds.2022.3230402
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Investigation of Recovery Phenomena in Hf<sub>0.5</sub>Zr<sub>0.5</sub>O<sub>2</sub>-Based 1T1C FeRAM
Journal article published in 2023 by
Jun Okuno 
,
Tsubasa Yonai,
Takafumi Kunihiro,
Yusuke Shuto,
Ruben Alcala ,
Maximilian Lederer ,
Konrad Seidel,
Thomas Mikolajick ,
Uwe Schroeder ,
Masanori Tsukamoto,
Taku Umebayashi
,
Tsubasa Yonai,
Takafumi Kunihiro,
Yusuke Shuto,
Ruben Alcala ,
Maximilian Lederer ,
Konrad Seidel,
Thomas Mikolajick ,
Uwe Schroeder ,
Masanori Tsukamoto,
Taku Umebayashi
This paper is made freely available by the publisher.
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