Published in
Institute of Electrical and Electronics Engineers, IEEE Journal of Emerging and Selected Topics in Circuits and Systems, 1(13), p. 422-435, 2023
DOI: 10.1109/jetcas.2023.3244485
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Scalable In-Memory Clustered Annealer With Temporal Noise of Charge Trap Transistor for Large Scale Travelling Salesman Problems
Journal article published in 2023 by
Anni Lu 
,
Jae Hur ,
Yuan-Chun Luo ,
Hai Li ,
Dmitri E. Nikonov ,
Ian A. Young ,
Yang-Kyu Choi ,
Shimeng Yu
,
Jae Hur ,
Yuan-Chun Luo ,
Hai Li ,
Dmitri E. Nikonov ,
Ian A. Young ,
Yang-Kyu Choi ,
Shimeng Yu
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