Published in
e-Prime - Advances in Electrical Engineering, Electronics and Energy, (1), p. 100018, 2021
DOI: 10.1016/j.prime.2021.100018
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Review on the degradation of GaN-based lateral power transistors
Journal article published in 2021 by
C. De Santi,
M. Buffolo,
I. Rossetto,
T. Bordignon,
E. Brusaterra,
A. Caria,
F. Chiocchetta,
D. Favero 
,
M. Fregolent,
F. Masin,
N. Modolo,
A. Nardo,
F. Piva ,
F. Rampazzo,
C. Sharma
and other authors.
,
M. Fregolent,
F. Masin,
N. Modolo,
A. Nardo,
F. Piva ,
F. Rampazzo,
C. Sharma
and other authors.
This paper was not found in any repository, but could be made available legally by the author.
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