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IOP Publishing, Journal of Physics: Conference Series, 1(2086), p. 012207, 2021

DOI: 10.1088/1742-6596/2086/1/012207

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Probing electric properties of GaP nanowires with Kelvin probe force microscopy

Journal article published in 2021 by Va A. Sharov ORCID, Pa A. Alekseev, Vv V. Fedorov, Is S. Mukhin
This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

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Abstract

Abstract Surface electronic properties of GaP nanowires were investigated using scanning probe force microscopy. I-V curves of individual free-standing NWs with different doping types were obtained. Surface Fermi level positions in the nanowires of different crystal phases and doping types were extracted using phase-modulated Kelvin probe force microscopy. The results indicate on weak Fermi level pinning in GaP nanowires. The difference between wurtzite and zinc blende GaP work function is observed.