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IOP Publishing, Materials Research Express, 4(9), p. 046301, 2022

DOI: 10.1088/2053-1591/ac5ef3

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Evolution of spectroscopy features in layered MoS<sub>x</sub>Se<sub>(2-x)</sub> solid solutions

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Distributing this paper is prohibited by the publisher

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Abstract

Abstract In this work we report the structural and spectroscopic characterization of the bulk MoSxSe2-x solid solutions synthesized by chemical vapor transport. The bulk crystals were analyzed by scanning electron microscopy (SEM), x-ray diffraction (XRD), energy dispersive spectroscopy (EDS), atomic force microscopy (AFM), x-ray photoelectron spectroscopy (XPS) and Raman spectroscopy. Electron microscopy evaluation of the layered materials shows two distinct types of crystals: flat and easily cleavable hexagonal microcrystals up to 50 μm in size, and agglomerated irregular crystals of 5–10 μm in size. XRD shows a consistent increase in interplanar spacing as the Se content is increased in the sample series. Raman spectra of bulk MoSxSe2-x obtained with three different excitation energies revealed first order phonon modes associated with pure MoS2 (x = 2) and MoSe2 (x = 0) along with a complex behavior of vibrational modes when x had intermediate values. XPS Mo3d line scans indicate a slight shift towards lower binding energies as the Se/S ratio increases, consistent with the expected energies of MoSe2. A simple and direct relationship can be established between the characteristic Raman peaks and the value of x, which can be useful for identifying the compositions of TMD crystals.