Published in

Wiley, Advanced Materials Interfaces, 19(8), 2021

DOI: 10.1002/admi.202100794

Links

Tools

Export citation

Search in Google Scholar

Interface Passivation and Hole Injection Improvement of Solution‐Processed White Organic Light‐Emitting Diodes through Embedding an Ultrathin Graphene Oxide Layer

This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

Full text: Unavailable

Green circle
Preprint: archiving allowed
Orange circle
Postprint: archiving restricted
Red circle
Published version: archiving forbidden
Data provided by SHERPA/RoMEO

Abstract

AbstractTo cut cost and improve device performance, expensive and acidic hole transport material (HTM) PEDOT:PSS is replaced by copper(I) thiocyanate (CuSCN) and NiOx in solution‐processed white organic light‐emitting diodes, respectively. However, the luminescence quenching caused by interfacial defects on the surfaces of CuSCN and NiOx limits the devices’ full potential. To crack the nuts, an ultrathin graphene oxide (GO) layer is inserted between hole transport layer (HTL) and emitting layer (EML) as a passivation layer. The time‐resolved photoluminescence spectra of EML intuitively prove the inhibitory effect of GO on exciton quenching. What is more, the ultraviolet photoelectron spectroscopy and impedance spectroscopy reveal that the ultrathin GO layer can also increase the work function of HTM and promote hole injection. Relative to the devices without a GO layer, the efficiency of CuSCN/GO‐containing device is enhanced from 18.1 cd A−1 (6.6 lm W−1) to 30.3 cd A−1 (19.8 lm W−1), and the device with NiOx/GO achieves an enhancement of power efficiency by 98%, from 10.1 to 20.0 lm W−1.