Published in
2020 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2020
DOI: 10.1109/nss/mic42677.2020.9507805
Institute of Electrical and Electronics Engineers, IEEE Transactions on Radiation and Plasma Medical Sciences, 4(6), p. 446-453, 2022
DOI: 10.1109/trpms.2021.3098448
Links
- ORCID
- Institute of Electrical and Electronics Engineers
- Institute of Electrical and Electronics Engineers
Tools
Deep Learning Signal Discrimination for Improved Sensitivity at High Specificity for CMOS Intraoperative Probes
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