Published in

ACS Applied Electronic Materials, 7(3), p. 3167-3176, 2021

DOI: 10.1021/acsaelm.1c00365

Links

Tools

Export citation

Search in Google Scholar

Influence of Interface on the Charge Carrier Mobility of La<sub>2</sub>Ti<sub>2</sub>O<sub>7</sub> Layered Perovskite Thin Films Measured by the Time-of-Flight Method

Journal article published in 2021 by Sébastien Leroy, Redouane Douali, Christian Legrand, Freddy Krasinski, Florent Blanchard ORCID, Pascal Roussel ORCID, Sébastien Saitzek ORCID, Jean-François Blach ORCID
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

Full text: Unavailable

Green circle
Preprint: archiving allowed
  • Must obtain written permission from Editor
  • Must not violate ACS ethical Guidelines
Upload
Orange circle
Postprint: archiving restricted
  • Must obtain written permission from Editor
  • Must not violate ACS ethical Guidelines
Upload
Red circle
Published version: archiving forbidden
Policy details
Data provided by SHERPA/RoMEO