Published in
American Institute of Physics, Journal of Applied Physics, 7(131), p. 075701, 2022
DOI: 10.1063/5.0080713
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Nanoscale imaging of dopant incorporation in n-type and p-type GaN nanowires by scanning spreading resistance microscopy
Journal article published in 2022 by
Ece N. Aybeke 
,
Alexandra-Madalina Siladie ,
Rémy Vermeersch ,
Eric Robin ,
Oleksandr Synhaivskyi ,
Bruno Gayral ,
Julien Pernot ,
Georges Brémond ,
Bruno Daudin
,
Alexandra-Madalina Siladie ,
Rémy Vermeersch ,
Eric Robin ,
Oleksandr Synhaivskyi ,
Bruno Gayral ,
Julien Pernot ,
Georges Brémond ,
Bruno Daudin
This paper was not found in any repository, but could be made available legally by the author.
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