Published in
American Chemical Society, Nano Letters, 8(21), p. 3372-3378, 2021
DOI: 10.1021/acs.nanolett.0c04491
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Nanoscale Dopant Profiling of Individual Semiconductor Wires by Capacitance–Voltage Measurement
Journal article published in 2021 by
Timothée Lassiaz 
,
Pierre Tchoulfian,
Fabrice Donatini,
Julien Brochet,
Romain Parize,
Gwénolé Jacopin,
Julien Pernot
,
Pierre Tchoulfian,
Fabrice Donatini,
Julien Brochet,
Romain Parize,
Gwénolé Jacopin,
Julien Pernot
This paper was not found in any repository; the policy of its publisher is unknown or unclear.
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- Must obtain written permission from Editor
- Must not violate ACS ethical Guidelines
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