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Institute of Electrical and Electronics Engineers, IEEE Transactions on Power Electronics, 11(36), p. 12158-12162, 2021

DOI: 10.1109/tpel.2021.3076002

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Impact of Drain Leakage Current on Short Circuit Behavior of GaN/SiC Cascode Devices

Journal article published in 2021 by Jiahui Sun ORCID, Zheyang Zheng ORCID, Kailun Zhong ORCID, Gang Lyu ORCID, Kevin J. Chen ORCID
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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