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Institute of Electrical and Electronics Engineers, IEEE Transactions on Industrial Electronics, 7(69), p. 7340-7348, 2022

DOI: 10.1109/tie.2021.3099247

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Short-Circuit Failure Mechanisms of 650-V GaN/SiC Cascode Devices in Comparison With SiC MOSFETs

Journal article published in 2022 by Jiahui Sun ORCID, Kailun Zhong ORCID, Zheyang Zheng ORCID, Gang Lyu ORCID, Kevin J. Chen ORCID
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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