Published in
American Chemical Society, ACS Applied Nano Materials, 3(4), p. 2664-2672, 2021
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Deep Learning-Based High Throughput Inspection in 3D Nanofabrication and Defect Reversal in Nanopillar Arrays: Implications for Next Generation Transistors
Journal article published in 2021 by
Utkarsh Anand 
,
Tanmay Ghosh ,
Zainul Aabdin ,
Nandi Vrancken,
Hongwei Yan ,
XiuMei Xu,
Frank Holsteyns,
Utkur Mirsaidov
,
Tanmay Ghosh ,
Zainul Aabdin ,
Nandi Vrancken,
Hongwei Yan ,
XiuMei Xu,
Frank Holsteyns,
Utkur Mirsaidov
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
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- Must obtain written permission from Editor
- Must not violate ACS ethical Guidelines
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- Must obtain written permission from Editor
- Must not violate ACS ethical Guidelines
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